Signadyne – Keysight collaboration leads to new PXI Reference Solution

Keysight Technologies (previously Agilent) has recently announced a new PXI Reference Solution for RF power amplifier (PA) characterization and test. The Reference Solution, which performs S-parameter, harmonic distortion, power and demodulation measurements, enables rapid, full characterization of next-generation power amplifier modules, such as a power amplifier-duplexer (PAD). The Reference Solution is optimized for high throughput and highly accurate measurement quality. It is the only small footprint, full characterization solution for design validation and product test of the RF power amplifier, as well as all of the passive devices surrounding the power amplifier, such as filters and duplexers.

The robust digital pre-distortion (DPD) algorithms in the Reference Solution are built on years of close cooperation with wireless manufacturing customers and insights gained from Keysight's SystemVue simulation and N7614B Signal Studio for Power Amplifier Test software applications. This makes it the only solution capable of providing consistent measurements, from simulation to manufacturing, for next-generation power amplifier modules.

"The combination of Keysight's excellence in RF solutions and Signadyne's know-how in high-speed generators has led to development of a comprehensive test solution that provides outstanding value to the RF power amplifier industry," said Marc Almendros, chief executive officer of Signadyne.

"We created the PXI Reference Solution for RF power amplifier characterization and test because customers told us that full characterization of PAD-type devices is critical to their success," said Mario Narduzzi, marketing manager of Keysight's Software and Modular Solutions Division. "Proven, robust digital pre-distortion algorithms, with open and closed loop measurements, deliver the best performance of any PA characterization test solution in the industry."