Functional Optoelectronic Nanomaterials
Prof. Dr. Gerasimos Konstantatos
gerasimos.konstantatos@icfo.euActivities
We employ solution-processed functional nanomaterials to address current challenges in optoelectronics, imaging, sensing and renewable energies.
We take advances in nanoscience and we transform them into nanotechnology for solving real-world problems that current technology cannot address or do so at an affordable cost for the benefit of the society. We follow a bottom-up approach engineering the properties of the materials from the atomic level, to the suprananocrystalline level and all the way up to device engineering. We are doing so by assembling a group of physicists, chemists and engineers to tackle interdisciplinary problems. Our focus lies on novel functional nanomaterials, nanostructures and devices for photodetection, light emission and renewable energies.
Group Research Interests
Publications Highlights
Adv. Mater. 2020, 2003830 (2020)
Funding
- ERC CoG 2016 – HEINSOL
- Graphene Flagship – WP Optoelectronics (Core 1,2,3)
- Plan Nacional – Mineco
Resources Available
Full-fledged Wet Chemistry Lab for material synthesis:
- 4 fumehoods with 5 Schlenk lines
- 1 glovebox with integrated spincoater
- 1 dry box
Post-processing/Device Fab Lab:
- 2 fumehoods with spincoaters
- 1 glovebox with integrated spincoater
- 1 Thermal evaporator
- 1 Atomic Layer Deposition System
- 2 Rapid thermal Annealing systems (RTP)
Optoelectronic Device Characterization Lab:
- Solar cell Characterization Suite: Class 3A solar simulator, TPV/TPC technique, EQE measurement
- Light Emission characterization: compact probe-station for L-I-V characterization, high-resolution spectrometer (600 – 1700 nm)
- ASE/Lasing characterization setup (inc. various pump laser sources (fs, ps, ns)
- Photodetector characterization Suite: 1 ambient probe station, 1 vacuum probestation (80K-350K), 2 semiconductor parameter analyzers with fA resolution, 1 supercontinuum laser source, 1 quantum cascade laser source, MWIR/LWIR monochromator for EQE measurements, 1 Step-scan FTIR system, several diode-laser sources, oscilloscope etc.