Job openings & fellowships Job openings
Select Page

Analysis and Metrology

 

Optical profilometer Sensofar S-Neox

This optical profilometer is a precision measurement tool that utilizes various objectives with different magnifications to obtain detailed surface topography of samples. It employs multiple techniques to capture high-resolution 2D and 3D images, enabling comprehensive analysis of surface features, flatness and surface texture as well as layer thickness.

Techniques

Confocal, Interferometry, Active Illumination Focus Variation and Spectroscopic Reflectometry

 

Objectives

EPI 5x, EPI 10x, EPI 20x, EPI 100x, TI 5x, DI 20

Sample size

200mm

Mechanical profilometer KLA P-7

The KLA P-7 mechanical profilometer is an advanced device designed for high-precision surface measurement and characterization. It utilizes a stylus that moves across the sample surface to measure surface roughness and topography, capturing detailed profiles of various materials. Additionally, it features a 3D mode for comprehensive surface analysis and a stress mode to evaluate residual stresses, making it a very versatile tool.

Modes

2D, 3D, 2D Stress

Sample size

Up to 200mm

 

AFM Veeco Dimension 3100

This Atomic Force Microscope is a high-resolution imaging tool used to characterize the surface topography and properties of materials at the nanoscale. It operates by scanning a sharp tip attached to a cantilever across the sample surface, where interactions between the tip and the sample generate detailed topographical maps.

Modes

Tapping, Contact

 

Sample size

Up to 150mm

SEM FEI InspectF

This Scanning Electron Microscope (SEM) uses a focused beam of electrons to produce detailed images of a sample by scanning its surface. This interaction generates signals that provide information about the sample’s topography and composition. This system includes Energy-dispersive X-ray spectroscopy (EDX) for elemental chemical analysis.

Acceleration voltage

1 to 30kV

 

Detectors

SE, BSE

Resolution

1.2 nm at 30kV

EDX resolution

<133eV

Sample size

Up to 50mm

Ellipsometer SOPRA GES-5E

This ellipsometer is an optical instrument that measures the thickness and optical properties of thin films by analyzing changes in light polarization upon reflection from a sample surface. It provides precise data on film thickness, refractive index, and absorption, making it valuable in materials science for non-destructive characterizatio

Spectral range

190-200mm

 

Sample size

Up to 200mm

 

Optical microscopes Olympus BX51

These optical microscopes are devices that use visible light and lenses to magnify, visualize and capture images of small objects or details not visible to the naked eye.

Objective

5x, 10x, 20x, 50x, 100x