Biography:

Peter is Chief Scientist at Zygo Corporation and cofounder of the Zygo Innovations Group—a corporate applied research team tasked with solving challenging problems in optical metrology using inventive instruments and methods. He has been developing optical instrument products and managing innovation for 35 years, leading to successful commercial products as well as to 140 US patents. As an academic researcher, he has published more than 200 papers, book chapters and review articles, while teaching as an adjunct professor, short course instructor and honorary professor. He is an SPIE Kingslake Award winner, a Fellow of Optica, AET, the Institute of Physics, and SPIE.

As an educator in science, engineering, and optics, he worked as a secondary school teacher in Benin, and as a teacher trainer and advocate for advancing science and engineering in Africa.

LECTURE: "Optical dimensional metrology"

Abstract:

How can I use optics to measure distances, shapes, textures, and material composition? This is the core question addressed by optical dimensional metrology, which leverages light-based technologies in applications ranging from measuring the distance between two walls in a house to determining the detailed dimensional parameters for computer chips created by photolithography. Modern optical metrology employs geometrical methods that can be understood from simple ray diagrams, as well as wave-based techniques such as interferometry that require a deeper understanding of physical optics.

In this presentation, I provide an overview of the world of optical metrology from the perspective of the invention, development, and marketing of measurement solutions based on advanced optical and photonic systems.

SEMINAR: "Cross-cultural photonics – How organizational culture impacts developments in optics"

Abstract:

Strong arguments favor accelerated adoption of optics and photonics, from energy independence to manufacturing metrology. However, it is not always as straightforward as developing the most inventive technical solution. Many obstacles to technology adoption reflect differences in local customs, economic conditions, even national culture, while others relate to differing reward systems in academia, industry, and government institutes.

An example of the impact of organizational culture is the expanded use of fast, non-contact optical measurements of surfaces, shapes, and positions as an enabler for manufacturing. High-precision techniques such as optical interferometry have advanced considerably and have found applications ranging from semiconductor wafer lithography to automotive engine production. Despite clear benefits, there are persistent obstacles to the more widespread adoption of optical techniques.

In this talk, I propose that understanding differences in organizational culture can assist in advancing optical methods that are adapted to the critical needs of data-driven manufacturing.